BIOS Flashing Using in-Target Probe (ITP) on System Under Tests (SUT) in INTELS System Validation Lab / by Lee Yuan Pin.

Main Author: LEE Yuan Pin
Language:English
Published: INTI International College Penang Stage 3 B.Eng Project.
Item Description:1 CD ROM
Project Supervisor: Miss Adele Kam
Bachelor of Engineering (Hons) in E & E Engineering 3+0 in Collaboration with University of Bradford UK.
Physical Description:Binding Books - Student Project + 1 CD.